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Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectral Images - Unbiased Analysis of the Entire 3-Dimensional Data Cube
Smentkowski, V SVolume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605500734
Date:
August, 2005
File:
PDF, 282 KB
english, 2005