Development of Automatic Magnification Calibration Function for Scanning Transmission Electron Microscope
Inada, H, Terauchi, D, Ozawa, M, Tsuneta, R, Tanaka, H, Konno, M, Watanabe, S I, Aizawa, S, Nakamura, K, Takane, AVolume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605500771
Date:
August, 2005
File:
PDF, 238 KB
english, 2005