Imaging Defects in Nanometer-scale Semiconductor...

Imaging Defects in Nanometer-scale Semiconductor Crystals: Statistical Nucleation Events are Few in Small Crystals, but can Control Growth

MoberlyChan, W J, Seryogin, G, Shalish, I, Wen, C-Y, Hu, S-F, Guo, X-J, Narayanamurti, V, Spaepen, F
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605502046
Date:
August, 2005
File:
PDF, 3.50 MB
english, 2005
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