![](/img/cover-not-exists.png)
Micro-Raman Characterization of Phase Formation and Thermal Stability of Nickel Silicide Thin Films.
Conti, G, Lazik, C, Uritsky, YVolume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605502617
Date:
August, 2005
File:
PDF, 296 KB
english, 2005