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Atomic Resolution Electron Tomography on a Discrete Grid: Atom Count Errors
Batenburg, K J, Jinschek, J R, Kisielowski, C FVolume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605502861
Date:
August, 2005
File:
PDF, 472 KB
english, 2005