Material Sensitive Microscopy on the Nanometer Scale

Material Sensitive Microscopy on the Nanometer Scale

Schmidt, U, Jauss, A, Vargas, F, Kress, M, Hollricher, O, Weishaupt, K
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Volume:
11
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605503398
Date:
August, 2005
File:
PDF, 537 KB
2005
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