Characterization of Epitaxial Semimetallic ErAs Particles...

Microscopy and Microanalysis 2005 / 8 Vol. 11; Iss. S02

Characterization of Epitaxial Semimetallic ErAs Particles in an In0.53Ga0.47As Matrix by High-Angle Annular Dark-Field Imaging

Klenov, D O, Driscoll, D C, Zimmerman, J D, Zide, J D, Gossard, A C, Stemmer, S
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605503805
Date:
August, 2005
File:
PDF, 1.39 MB
english, 2005
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