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Application of Exit-Plane Wave Function Images in High-Resolution Transmission Microscopy for Compositional Analysis of III-V Semiconductor Interfaces
Mahalingam, K, Eyink, K, Brown, G, Dorsey, D, Kisielowski, C, Thust, AVolume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605506251
Date:
August, 2005
File:
PDF, 179 KB
english, 2005