Measuring the Characteristic Length Scale of Medium Range...

Measuring the Characteristic Length Scale of Medium Range Order in Amorphous Silicon Using Variable Resolution Fluctuation Electron Microscopy

Nittala, L N, Twesten, R D, Voyles, P M, Abelson, J R
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605506779
Date:
August, 2005
File:
PDF, 189 KB
english, 2005
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