Electron Skirts and X-ray Correction: Evaluating Methods...

Microscopy and Microanalysis 2005 / 8 Vol. 11; Iss. S02

Electron Skirts and X-ray Correction: Evaluating Methods for Rapid Discrimination of Primary versus Secondary X-ray Signals in the ESEM

Doehne, E
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605506822
Date:
August, 2005
File:
PDF, 718 KB
english, 2005
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