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What are the Limitations in the Characterization of Self-Assembled Metamaterials using Advanced Microscopy Techniques?
Kiely, C J, Watanabe, M, Burrows, A, Clasen, P, Harmer, M P, Rodriguez-Gonzalez, B, Liz-Marzan, L, Hussain, I, Fink, J, Brust, MVolume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605507153
Date:
August, 2005
File:
PDF, 339 KB
english, 2005