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Introduction to the Capabilities and Applications of the World's Largest Chamber Scanning Electron Microscope
Dekanich, S, Frafjord, J, Carpenter, D, Bolinger, BVolume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605507220
Date:
August, 2005
File:
PDF, 190 KB
english, 2005