Implantation, Sputtering and Electromigration: Kelvin Probe...

Microscopy and Microanalysis 2005 / 8 Vol. 11; Iss. S02

Implantation, Sputtering and Electromigration: Kelvin Probe Microscopy of Focussed Ion Beam Processed SIMOX.

Stevens-Kalceff, M A, Sobey, T L
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605507864
Date:
August, 2005
File:
PDF, 146 KB
english, 2005
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