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Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope
Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Haider, MaximilianVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606060600
Date:
December, 2006
File:
PDF, 565 KB
english, 2006