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A New Material for the Performance Check of X-ray Spectrometers Attached to a SEM
Procop, M, Hodoroaba, V-D, Griepentrog, MVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606061307
Date:
August, 2006
File:
PDF, 171 KB
english, 2006