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Atomic Scale Characterization of HgTe/CdTe Superlattices Using STEM Z-Contrast Imaging and VEELS
Fu, L, Browning, N, Jung, H-S, Grein, CVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606061344
Date:
August, 2006
File:
PDF, 360 KB
english, 2006