![](/img/cover-not-exists.png)
Gridless TEM Supports Promise Greater Experimental Throughput
Hollis, PS, Powell, FRVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606061587
Date:
August, 2006
File:
PDF, 564 KB
english, 2006