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Analysis of Stresses and Strains around Dislocations at Grain Boundaries by Quantitative High-Resolution Electron Microscopy
Hytch, M, Putaux, J-L, Thibault, JVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606062581
Date:
August, 2006
File:
PDF, 371 KB
english, 2006