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Imaging of Hafnium Atoms and Clusters in Silicon Dioxide
Klenov, DO, Mates, TE, Stemmer, SVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606063008
Date:
August, 2006
File:
PDF, 450 KB
english, 2006