Separation of Bulk and Surface-losses in Low-loss EELS...

Microscopy and Microanalysis 2006 / 8 Vol. 12; Iss. S02

Separation of Bulk and Surface-losses in Low-loss EELS Measurements in STEM

Mkhoyan, KA, Babinec, T, Maccagnano, SE, Kirkland, EJ, Silcox, J
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606063045
Date:
August, 2006
File:
PDF, 215 KB
english, 2006
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