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Studying Trapped Grains in Alumina using SEM and EBSD
Riesterer, JL, Farrer, JK, Ravishankar, N, Carter, CBVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606063069
Date:
August, 2006
File:
PDF, 347 KB
english, 2006