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The Development of Ultra-high Vacuum Cs-Corrected Scanning Transmission Electron Microscope for Fast Fabrication of Desired Nanostructures
Furuya, K, Mitsuishi, K, Tanaka, M, Takeguchi, M, Kondo, Y, Hosokawa, F, Okamoto, K, Sannomiya, T, Hori, M, Iwama, T, Kawazoe, MVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606063197
Date:
August, 2006
File:
PDF, 541 KB
english, 2006