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The Effect of the Charge Compensating Gas and Beam Gas Path Length on X-ray Analysis in the Variable Pressure SEM
Bean, SJ, Kugler, VMVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606063264
Date:
August, 2006
File:
PDF, 224 KB
english, 2006