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New Method of Preparing Cross Sectional Samples and Ultra-Thin Foils for SEM and TEM by a Broad Argon Ion Beam
Ogura, K, Erdman, N, Campbell, AR, Asahina, SVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606063276
Date:
August, 2006
File:
PDF, 263 KB
english, 2006