Atomic Resolution Electron Tomography Based on Discrete Mathematics
Jinschek, JR, Batenburg, KJ, Calderon, HA, Kilaas, R, Radmilovic, V, Kisielowski, CVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606063720
Date:
August, 2006
File:
PDF, 221 KB
english, 2006