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Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis
Lawrence, D, Thompson, K, Larson, DJ, Gorman, BVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606064099
Date:
August, 2006
File:
PDF, 258 KB
english, 2006