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Single Shot Electron Diffraction Experiment Using a Sub ps MeV Electron Source
Schmerge, JF, Cardoza, J, Castro, J, Dowell, DH, Gierman, SM, Hastings, JB, Loos, H, Rudakov, FM, Weber, PMVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606064154
Date:
August, 2006
File:
PDF, 93 KB
english, 2006