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Characterization of Sputtered Ge-Sn Thin Films by High Resolution Methods
Calderón, HA, Vidal, MA, Ladrón de Guevara, HVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606064324
Date:
August, 2006
File:
PDF, 588 KB
english, 2006