Characterization of Porous GaN-Nanostructured Rods by TEM...

Microscopy and Microanalysis 2006 / 8 Vol. 12; Iss. S02

Characterization of Porous GaN-Nanostructured Rods by TEM Techniques

Zheng, J-G, Ding, S, Wu, M
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606064610
Date:
August, 2006
File:
PDF, 640 KB
english, 2006
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