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Determination of Projected Potential Profiles Across Interfaces Using Through Focal Series Reconstruction
Bhattacharyya, S, Koch, CT, Rühle, MVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606064701
Date:
August, 2006
File:
PDF, 182 KB
english, 2006