Dedicated FIB Preparation for TEM Cross-section Samples of...

Microscopy and Microanalysis 2006 / 8 Vol. 12; Iss. S02

Dedicated FIB Preparation for TEM Cross-section Samples of Nanowires Grown Vertically on Silicon Substrates

Kaiser, M, Verheijen, MA, Roest, AL, Bakkers, EPAM
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606064750
Date:
August, 2006
File:
PDF, 578 KB
english, 2006
Conversion to is in progress
Conversion to is failed