![](/img/cover-not-exists.png)
High Resolution Imaging Using the Oxford Aberration Corrected TEM.
Hetherington, C, Kirkland, A, Doole, R, Cockayne, D, Titchmarsh, J, Hutchison, JVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065093
Date:
August, 2006
File:
PDF, 549 KB
english, 2006