High Resolution Imaging Using the Oxford Aberration...

High Resolution Imaging Using the Oxford Aberration Corrected TEM.

Hetherington, C, Kirkland, A, Doole, R, Cockayne, D, Titchmarsh, J, Hutchison, J
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065093
Date:
August, 2006
File:
PDF, 549 KB
english, 2006
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