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Retardation Effects in Valence – EELS Spectra
Stöger-Pollach, M, Hébert, C, Schattschneider, P, Laister, AVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065160
Date:
August, 2006
File:
PDF, 205 KB
english, 2006