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Characterization of Ni-base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques
Watanabe, M, Saxey, D, Zheng, R, Williams, D, Ringer, SVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065329
Date:
August, 2006
File:
PDF, 285 KB
english, 2006