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Near-Simultaneous Core- and Low-Loss EELS Spectrum-Imaging in the STEM using a Fast Beam Switch.
Thomas, P, Scott, J, MacKenzie, M, McFadzean, S, Wilbrink, J, Craven, AVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065512
Date:
August, 2006
File:
PDF, 253 KB
english, 2006