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Strain Tensor Mapping at the Nanoscale using Electron Back Scatter Diffraction
Wilkinson, A, Meaden, G, Dingley, DVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606065883
Date:
August, 2006
File:
PDF, 138 KB
english, 2006