High Spatial Resolution Analytical Electron Microscopic...

Microscopy and Microanalysis 2006 / 8 Vol. 12; Iss. S02

High Spatial Resolution Analytical Electron Microscopic Investigation of Femtosecond-Laser-Induced Crystallization of a-Si:H Films

Oleshko, VP, Nayak, BK, Gupta, MC
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606066050
Date:
August, 2006
File:
PDF, 1.83 MB
english, 2006
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