Combined SEM Electron-Beam-Induced Current and Cathodoluminescence Imaging and STEM Structural Analysis of GaN Light Emitting Diodes
Parish, CM, Progl, CL, Salmon, ME, Russell, PEVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606066578
Date:
August, 2006
File:
PDF, 442 KB
english, 2006