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Diffuse Scattering of Electrons by Individual nm-sized Defects Reveals New Structural Details
Kirk, M, Davidson, R, Zhou, Z, Dudarev, S, Jenkins, M, Sutton, AVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606066645
Date:
August, 2006
File:
PDF, 378 KB
english, 2006