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Composition of 4H-SiC/SiO2 Interfaces by Electron Energy-Loss Spectroscopy
Bentley, J, Chang, K-C, Cao, Y, Porter, LMVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606066736
Date:
August, 2006
File:
PDF, 268 KB
english, 2006