Analysis of Defects in HgCdTe and CdTe Epilayers on Si by...

Analysis of Defects in HgCdTe and CdTe Epilayers on Si by Dual-Beam FIB

Lee, T, Huang, J, Cha, DK, Jacobs, RN, Dinan, JH, Kim, MJ
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606066815
Date:
August, 2006
File:
PDF, 306 KB
english, 2006
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