Atomic Scale Compositional and Structural Characterization...

Microscopy and Microanalysis 2006 / 8 Vol. 12; Iss. S02

Atomic Scale Compositional and Structural Characterization of Nanostructured Materials Using Combined FIB, STEM, and LEAP

Gorman, B, Diercks, D, Kaufman, M, Ulfig, R, Lawrence, D, Thompson, K, Larson, D
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606066979
Date:
August, 2006
File:
PDF, 513 KB
english, 2006
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