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Added Information to TEM Samples by Chemical Stain – Applications to Silicon Devices
Tsung, L, Anciso, A, Matheson, D, Turner, RVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606067110
Date:
August, 2006
File:
PDF, 620 KB
english, 2006