Focused Ion Beam Enabled Analysis of Nanocomposite and...

Focused Ion Beam Enabled Analysis of Nanocomposite and Nanostructured Soft Materials

Kooi, SE, Jang, J-H, Ullal, C, Thomas, EL
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606067171
Date:
August, 2006
File:
PDF, 434 KB
english, 2006
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