Focused Ion Beam Enabled Analysis of Nanocomposite and Nanostructured Soft Materials
Kooi, SE, Jang, J-H, Ullal, C, Thomas, ELVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606067171
Date:
August, 2006
File:
PDF, 434 KB
english, 2006