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Screening of Individual Nanostructures with STEM-EELS and EFTEM Spectral Imaging
Anderson, I, Scott, J, Klein, K, Melechko, A, Simpson, MVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606067894
Date:
August, 2006
File:
PDF, 239 KB
english, 2006