Generation of Spurious X-rays by Focused Ion Beams in Dual...

Generation of Spurious X-rays by Focused Ion Beams in Dual Beam Instruments

Evertsen, J, Toth, M, Thiel, B, Lifshin, E
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606068000
Date:
August, 2006
File:
PDF, 211 KB
english, 2006
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