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In-situ TEM-STM Investigation of Conductance in Cu Atomic Wires
Rullan, JL, Dunn, KAVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606068267
Date:
August, 2006
File:
PDF, 254 KB
english, 2006