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Property Map by Electron Spectroscopy Imaging Series
Chen, F-R, Kai, J-J, Lin, J-J, Chang, L, Egerton, RVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606068462
Date:
August, 2006
File:
PDF, 238 KB
english, 2006