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Requisites for Ultimate Energy Resolution EELS and Band Gap Measurements
Essers, E, Hoeschen, R, Matijevic, M, Benner, G, Koch, CVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606068905
Date:
August, 2006
File:
PDF, 142 KB
english, 2006