Using STEM Image as a Map for Parallel Beam Electron Diffraction from a Nano-Particle on a TEM-STEM System
He, H, Spence, JC HVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606068978
Date:
August, 2006
File:
PDF, 419 KB
english, 2006